000 01307pam a2200325 a 4500
001 4979290
003 OSt
005 20210129113100.0
008 980310s1998 nyua b 001 0 eng
010 _a 98016162
020 _a0521550564
020 _a0521559596 (pbk.)
040 _aDLC
_cATU
_dDLC
050 0 0 _aTK7871.99.M44
_b.T19 1998
082 0 0 _a621.39/5
_221
100 1 _aTaur, Yuan,
_d1946-
_911870
245 1 0 _aFundamentals of modern VLSI devices /
_cYuan Taur, Tak H. Ning.
260 _aCambrige, UK ;
_aNew York :
_bCambridge University Press,
_c1998.
300 _axxii, 469 p. :
_bill. ;
_c26 cm.
504 _aIncludes bibliographical references (p. 449-460) and index.
650 0 _aMetal oxide semiconductors, Complementary.
_911869
650 0 _aBipolar transistors.
_911871
650 0 _aIntegrated circuits
_xVery large scale integration.
_911872
700 1 _aNing, Tak H.,
_d1943-
_911873
856 4 1 _3Table of contents
_uhttp://www.loc.gov/catdir/toc/cam024/98016162.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/cam029/98016162.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2lcc
_cBOOK
999 _c6198
_d6198