000 01124cam a2200313 a 4500
001 2926560
003 OSt
005 20210126151230.0
008 890926s1990 nyua b 001 0 eng
010 _a 89024887
020 _a0442318480
040 _aDLC
_cATU
_dDLC
050 0 0 _aTK5103
_b.At12 1990
082 0 0 _a621.382
_220
100 _aKlinger, David J.(Editor)
_911284
245 0 0 _aAT&T reliability manual /
_cedited by David J. Klinger, Yoshinao Nakada, Maria A. Menendez (AT&T Bell Laboratories).
260 _aNew York :
_bVan Nostrand Reinhold,
_cc1990.
300 _axi, 225 p. :
_bill ;
_c27 cm.
500 _aRev. ed. of: Reliability information notebook. 5th ed.
504 _aIncludes bibliographical references.
650 0 _aTelecommunication
_xEquipment and supplies
_xReliability.
_911285
700 1 _aNakada, Yoshinao.
_911286
700 1 _aMenendez, Maria A.
_911287
710 2 _aAT & T Bell Laboratories.
_911288
730 0 _aReliability information notebook.
_911289
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2lcc
_cBOOK
999 _c5813
_d5813