000 | 01259pam a2200325 a 4500 | ||
---|---|---|---|
001 | 2598295 | ||
003 | OSt | ||
005 | 20201216130439.0 | ||
008 | 970616s1998 nyua b 001 0 eng | ||
010 | _a 97026081 | ||
020 | _a0070576971 | ||
040 |
_aDLC _cATU _dDLC |
||
050 | 0 | 0 |
_aQC611.24 _b.R87 1998 |
082 | 0 | 0 |
_a621.3815/2/0287 _221 |
100 | 1 |
_aRunyan, W. R. _96622 |
|
245 | 1 | 0 |
_aSemiconductor measurements and instrumentation / _cW.R. Runyan and T.J. Shaffner. |
250 | _a2nd ed. | ||
260 |
_aNew York : _bMcGraw Hill, _cc1998. |
||
300 |
_ax, 453 p. : _bill. ; _c24 cm. |
||
504 | _aIncludes bibliographical references and index. | ||
650 | 0 |
_aSemiconductors. _96661 |
|
650 | 0 |
_aPhysical measurements. _95768 |
|
700 | 1 |
_aShaffner, T. J. _96623 |
|
856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/bios/mh041/97026081.html |
856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/description/mh023/97026081.html |
856 | 4 | 1 |
_3Table of contents _uhttp://www.loc.gov/catdir/toc/mh022/97026081.html |
906 |
_a7 _bcbc _corignew _d1 _eocip _f19 _gy-gencatlg |
||
942 |
_2lcc _cBOOK |
||
999 |
_c3380 _d3380 |