000 01259pam a2200325 a 4500
001 2598295
003 OSt
005 20201216130439.0
008 970616s1998 nyua b 001 0 eng
010 _a 97026081
020 _a0070576971
040 _aDLC
_cATU
_dDLC
050 0 0 _aQC611.24
_b.R87 1998
082 0 0 _a621.3815/2/0287
_221
100 1 _aRunyan, W. R.
_96622
245 1 0 _aSemiconductor measurements and instrumentation /
_cW.R. Runyan and T.J. Shaffner.
250 _a2nd ed.
260 _aNew York :
_bMcGraw Hill,
_cc1998.
300 _ax, 453 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographical references and index.
650 0 _aSemiconductors.
_96661
650 0 _aPhysical measurements.
_95768
700 1 _aShaffner, T. J.
_96623
856 4 2 _3Contributor biographical information
_uhttp://www.loc.gov/catdir/bios/mh041/97026081.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/mh023/97026081.html
856 4 1 _3Table of contents
_uhttp://www.loc.gov/catdir/toc/mh022/97026081.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2lcc
_cBOOK
999 _c3380
_d3380