| 000 | 00595pam a2200217 a 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20201216121648.0 | ||
| 008 | 970616s1998 nyua b 001 0 eng | ||
| 010 | _a | ||
| 020 | _a0070576971 | ||
| 040 | _cATU | ||
| 050 | 0 | 0 |
_aQC611.24 _b.R87 1998 |
| 100 | 1 |
_aRunyan, W. R. _96622 |
|
| 245 | 1 | 0 | _aSemiconductor measurements and instrumentation / |
| 250 | _a2nd ed. | ||
| 260 |
_aNew York _bMcGraw Hill, _c1998. |
||
| 300 |
_ax, 453 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references and index. | ||
| 700 | 1 |
_aShaffner, T. J. _96623 |
|
| 942 |
_2lcc _cBOOK |
||
| 999 |
_c3358 _d3358 |
||