Fundamentals of modern VLSI devices /
Yuan Taur, Tak H. Ning.
- Cambrige, UK ; New York : Cambridge University Press, 1998.
- xxii, 469 p. : ill. ; 26 cm.
Includes bibliographical references (p. 449-460) and index.
0521550564 0521559596 (pbk.)
98016162
Metal oxide semiconductors, Complementary. Bipolar transistors. Integrated circuits--Very large scale integration.