Weil, Michelle M.

TechnoStress : coping with technology @work @home @play / Techno stress Michelle M. Weil, Larry D. Rosen. - New York : J. Wiley, c1997. - xiii, 240 p. ; 23 cm.

Includes bibliographical references (p. 221-231) and index.

0471177091 (cloth : alk. paper)

97016114


Technology--Social aspects.
Technology--Psychological aspects.
Stress (Psychology)

T14.5 / .W42 1997

155.9/1