TY  - BOOK
AU  - Runyan,W.R.
AU  - Shaffner,T.J.
TI  - Semiconductor measurements and instrumentation
SN  - 0070576971
AV  - QC611.24 .R87 1998
PY  - 1998///
CY  - New York 
PB  - McGraw Hill
N1  - Includes bibliographical references and index
ER  -