Runyan, W. R. <br/><br/>
Semiconductor measurements and instrumentation / 

 - 2nd ed. 
 - New York   McGraw Hill,  1998. 
 - x, 453 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>0070576971 
<br/><br/><label>LCCN: </label>
<br/><br/><label>LC Class. No.: </label>QC611.24  / .R87 1998